The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Sep. 21, 2021
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Christian Huemmer, Lichtenfels, DE;

Andreas Fieselmann, Erlangen, DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); G06T 7/0012 (2013.01); A61B 2034/2065 (2016.02); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20101 (2013.01); G06T 2207/30012 (2013.01);
Abstract

A method is for determining a positioning quality of an external apparatus inserted into a patient's body. In the method, image data of the patient's body is detected; an at least one first anatomical landmark is detected in or with a first subregion, in which the external apparatus is positioned as expected; at least a first subsection of the external apparatus is sought in or with the at least one first subregion; a second anatomical landmark is detected in or with at least one second subregion; at least one second subsection is then detected based upon the already localized subsection; and a quality of the positioning of the at least one second subsection is determined by measuring a suitable dimension between the localized at least one second subsection and the at least one second landmark. A training method, a positioning quality determination facility and a training facility are also disclosed.


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