The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Jun. 20, 2022
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Hua Xie, Cambridge, MA (US);

Man Nguyen, Melrose, MA (US);

Jean-Luc Francois-Marie Robert, Cambridge, MA (US);

William Tao Shi, Wakefield, MA (US);

Claudia Errico, Medford, MA (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/5269 (2013.01); A61B 8/461 (2013.01); A61B 8/488 (2013.01); A61B 8/54 (2013.01); G01S 7/52036 (2013.01); G01S 7/52053 (2013.01); G01S 15/8915 (2013.01); G01S 15/8979 (2013.01);
Abstract

An ultrasonic diagnostic imaging system and method produce attenuation coefficient maps of a region of interest in an ultrasound image. In order to detect the presence of elevation aperture blockage, the system estimates attenuation coefficients by two different methods. The estimates produced by the two different methods are combined to produce a metric, which is evaluated as a function of depth. If the metric satisfies one or more criteria of measurement bias, elevation aperture blockage is identified and an alert of the blockage is produced for the user.


Find Patent Forward Citations

Loading…