The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Mar. 14, 2024
Ishida Co., Ltd., Kyoto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes an irradiation unit configured to irradiate a conveyed article with X-rays, an X-ray sensor unit including a sensor unit configured to detect the X-rays by photon counting and an image generation unit configured to generate an image based on a detection result output from the sensor unit, and a control unit having a first mode for inspecting the article based on the image and a second mode for determining a state of the X-ray sensor unit at a time of time delay integration driving, in which the control unit is configured to compare a first image generated based on a detection result output from the sensor unit at a time twith a second image generated by integrating detection results output from the sensor unit until a time tafter the time tto determine the state of the X-ray sensor unit.