The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

May. 03, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Roi Harpaz, Center District, IL;

Leonid Tsukerman, Haifa District, IL;

Yaron Hefetz, Herzeliya, IL;

Assignee:

GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G01T 1/29 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/037 (2013.01); G01T 1/2985 (2013.01); G01T 7/005 (2013.01);
Abstract

Methods and systems are provided for calibrating a single photon emission computed tomography (SPECT) imaging system. In one example, a collimated line source for calibrating a SPECT system comprises a radioactive material aligned along a central axis of the collimated line source and a plurality of collimator plates arranged perpendicularly around the central axis, the collimator plates including a material that substantially absorbs photons striking the collimator plates. The collimator plates may absorb photons emitted by the radioactive material in non-perpendicular directions, which are not used for calibrating the SPECT imaging system, thereby reducing an amount of radiation released in an environment of the SPECT imaging system during calibration. Due to the reduced amount of radiation to which people in the environment are exposed, short time increments between patient examinations may be advantageously used to collect calibration data, reducing an overall amount of time used for calibration.


Find Patent Forward Citations

Harpaz, Roi. (2026). Systems and methods for spect detector calibration (U.S. Patent No. 12611148). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12611148

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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