The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Apr. 03, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kwonjong Lee, Suwon-si, KR;

Sundo Kim, Suwon-si, KR;

Sangwon Jung, Suwon-si, KR;

Jungsoo Jung, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01);
Abstract

The disclosure relates to a 5generation (5G) communication system or a 6generation (6G) communication system for supporting higher data rates beyond a 4generation (4G) communication system such as long term evolution (LTE). A method performed by a base station in a wireless communication system is provided. The method includes identifying a first terminal for measuring a cross-link interference (CLI)-reference signal (RS) and a plurality of terminals for transmitting CLI-RSs, determining a plurality of groups including at least one CLI-RS resource, transmitting, to the first terminal, information on the determined plurality of groups, transmitting, to a second terminal among the plurality of terminals, configuration information on a group of CLI-RS resources corresponding to the second terminal, and receiving, from the first terminal, a CLI measurement result which is measured based on the configuration information on the group of the CLI-RS resources.


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