The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Oct. 22, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryo Mizushima, Tokyo, JP;

Hirofumi Ueda, Tokyo, JP;

Tomohiko Yagyu, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); H04L 63/145 (2013.01); H04L 2463/146 (2013.01);
Abstract

Generation of an attack scenario to be used for risk analysis of a system to be analyzed is enabled without depending on the technique and the knowledge of a person who creates it. An analysis result acquisition means acquires a risk analysis result of a first risk analysis performed on a system to be analyzed. A condition acquisition means acquires conditions for an attack scenario to be used for a second risk analysis on the basis of an attack scenario table and the risk analysis result. An attack scenario generation means generates an attack scenario to be used for the second risk analysis on the basis of the conditions for the attack scenario acquired by the condition acquisition means.


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