The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jun. 25, 2024
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Koji Sasaki, Osaka, JP;
PANASONIC PROJECTOR & DISPLAY CORPORATION, Osaka, JP;
Abstract
An abnormality monitoring method is an abnormality monitoring method using a monitoring device communicably connected to a plurality of terminals via a network. The abnormality monitoring method includes: transmitting a request to a plurality of terminals; receiving one or more responses respectively transmitted in response to the request by one or more terminals among the plurality of terminals; determining, based on the one or more responses, whether or not an abnormality has occurred in at least one of (i) a first terminal of the plurality of terminals or (ii) a first communication route of the plurality of communication routes; generating abnormality information indicating that an abnormality has occurred in at least one of the first terminal or the first communication route when the abnormality has occurred; and presenting the abnormality information generated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile