The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Mar. 07, 2022
Applicant:

Japan Science and Technology Agency, Kawaguchi, JP;

Inventors:

Takumi Sannomiya, Tokyo, JP;

Sotatsu Yanagimoto, Tokyo, JP;

Keiichirou Akiba, Tokyo, JP;

Hikaru Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); G01N 23/2251 (2018.01); H01J 37/22 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/26 (2013.01); G01N 23/2251 (2013.01); H01J 37/222 (2013.01); H01J 37/244 (2013.01); H01J 2237/2445 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/24585 (2013.01);
Abstract

An electron microscope of an embodiment according to the present invention includes an electron gun for irradiating a sample with electrons; an electron detector for detecting the electrons with which the sample is irradiated; a photon detector for detecting photons emitted from the sample when the sample is irradiated with the electrons; and a computing device that computes, for each of the detected photons, a time difference between the time of irradiation of the sample with the electron and the time of emission of the photon from the sample, based on the time of detection of the electron by the electron detector and the time of detection of the photon by the photon detector, and that computes electron-photon time correlation indicating the distribution of the time difference.


Find Patent Forward Citations

Sannomiya, Takumi. (2026). Electron microscope, device for measuring electron-photon correlation, and method for measuring electron-photon correlation (U.S. Patent No. 12609273). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12609273

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