The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

May. 19, 2023
Applicants:

Leica Mikrosysteme Gmbh, Vienna, AT;

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Thomas Pfeifer, Vienna, AT;

Heinz Plank, Vienna, AT;

Miriam Weller, Wetzlar, DE;

Konrad Winkler, Vienna, AT;

Rainer Wogritsch, Vienna, AT;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/204 (2013.01);
Abstract

A sample holder includes a main component comprising a first surface area, and a retaining mechanism comprising a holding component. The retaining mechanism is configured to retain a sample between the holding component of the retaining mechanism and the first surface area in a closed state of the retaining mechanism. The retaining mechanism is further configured to enter an opened state upon mechanical actuation of the retaining mechanism. The opened state allows insertion and removal of the sample. The retaining mechanism is further configured to revert to the closed state once the mechanical actuation is removed.


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