The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Nov. 21, 2023
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventor:

Jong Seok Jung, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/40 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/023 (2013.01); G11C 29/12005 (2013.01); G11C 2029/4002 (2013.01);
Abstract

A test circuit including a test core configured to set a charging current quantity as a first value and perform charging and discharging on a test node of a test target circuit during a first measurement interval and configured to change the charging current quantity from the first value to a second value and perform charging and discharging on the test node during a second measurement interval, and an operation circuit configured to generate a first counting value by counting a clock signal during the first measurement interval, generate a second counting value by counting the clock signal during the second measurement interval, generate the results of an operation of the first counting value and the second counting value as operation results, and output at least one of the first counting value, the second counting value, and the operation results as test result information.


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