The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jul. 25, 2024
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventor:

Xiaochen Zhu, Milpitas, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 29/021 (2013.01); G11C 29/025 (2013.01);
Abstract

An apparatus is provided that includes a memory die including non-volatile memory cells coupled to a signal line, a switching circuit including a control terminal coupled to a first conductor, the switching circuit configured to selectively couple the signal line to a power supply based on a signal level on the first conductor, a second conductor capacitively coupled to the first conductor, and a control circuit coupled to the switching circuit. The control circuit is configured to detect a defect in the first conductor by coupling the second conductor to a first voltage source, coupling the signal line to a second voltage source, and detecting a drop in a voltage of the second voltage source.


Find Patent Forward Citations

Zhu, Xiaochen. (2026). Apparatus and methods for detecting coupling faults in non-volatile memory devices (U.S. Patent No. 12609175). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12609175

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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