The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jul. 26, 2023
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Chenxi Liu, Seattle, WA (US);

Ruimin Ke, Seattle, WA (US);

Yinhai Wang, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/56 (2022.01); G06T 7/90 (2017.01); G06V 10/60 (2022.01);
U.S. Cl.
CPC ...
G06V 10/56 (2022.01); G06T 7/90 (2017.01); G06V 10/60 (2022.01); G06T 2207/10024 (2013.01);
Abstract

An edge device can include a processing device, an image sensor, and a memory having instructions that are executable by the processing device for causing the processing device to perform operations. The processing device can receive, from the image sensor, an image of an environment. The processing device can determine a visibility measure corresponding to the environment by determining a dark channel of the image, determining, based on the dark channel of the image, a transmission map of the image, and determining, based on the transmission map, a visual contrast of the image. The processing device can generate information corresponding to the visibility measure.


Find Patent Forward Citations

Liu, Chenxi. (2026). Determining a visibility measure based on an image of an environment (U.S. Patent No. 12608907). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12608907

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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