The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Dec. 28, 2022
Applicant:
Nuvi Labs Co., Ltd., Incheon, KR;
Inventors:
Assignee:
NUVI LABS CO., LTD., Incheon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/62 (2017.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 7/50 (2017.01); G06T 7/90 (2017.01); G06V 10/764 (2022.01); G06V 10/766 (2022.01); G06V 10/77 (2022.01); G06V 10/776 (2022.01); G06V 10/80 (2022.01); G06V 20/68 (2022.01);
U.S. Cl.
CPC ...
G06T 7/62 (2017.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 7/50 (2017.01); G06T 7/90 (2017.01); G06T 7/97 (2017.01); G06V 10/764 (2022.01); G06V 10/766 (2022.01); G06V 10/7715 (2022.01); G06V 10/776 (2022.01); G06V 10/806 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20212 (2013.01); G06V 20/68 (2022.01);
Abstract
Provided are a method and an apparatus for measuring an object quantity using a 2D image. A method for measuring an object quantity using a 2D image according to one embodiment of the present disclosure comprises learning an object region model in a first object image which is a pre-learning target, learning an object quantity model for a first object region in the first object image using a feature map extracted from the first object image, and measuring an object quantity of at least one of a second object region and a background region in a second object image which is a measurement target using the learned object region model and object quantity model.