The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Feb. 08, 2022
Applicant:
Lunit Inc., Seoul, KR;
Inventors:
Assignee:
Lunit Inc., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); G06T 7/62 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30096 (2013.01);
Abstract
A method for measuring a size change of a target lesion in an X-ray image is provided, including receiving a first X-ray image including the target lesion and a second X-ray image including the target lesion, calculating an occupancy of a region corresponding to the target lesion in criterion regions in each of the first X-ray image and the second X-ray image, and measuring a size change of the target lesion based on the calculated occupancies.