The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jan. 03, 2023
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventor:

Bingcai Zhang, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/4053 (2024.01); G06T 3/4046 (2024.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 3/4046 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/10036 (2013.01);
Abstract

System and methods for generating super resolution images from geospatial images having any number of bands. A super resolution model, which uses deep convolution neural networks (DCNNs), is trained using individual image bands, a large crop size or tile size of 512×512 pixels, and a de-noise algorithm. Applying one or more algorithms to maintain the original color of the image bands improves the quality metrics of the super resolution images as measured by PSNR (peak signal-to-noise ratio) and SSIM (structural similarity index measure) of super resolution images. Further applying one or more algorithms to remove border effects introduced during the disclosed process reduces and/or eliminates seam lines between tiles and enhances the overall accuracy of the super resolution images.


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