The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jun. 11, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Maya Okawa, Tokyo, JP;
Hiroyuki Toda, Tokyo, JP;
NTT, Inc., Tokyo, JP;
Abstract
An object is to make it possible to accurately detect abnormality of event data. A training unit () trains a parameter of a model based on a plurality of event series that are event data in a time series and labels that indicate abnormality or normality with respect to event data of each of the plurality of event series, the model outputting a degree of abnormality of a target event series when the target event series is input, the target event series being an event series of which the degree of abnormality is to be predicted, the parameter being trained to optimize an objective function that represents a relationship between a probability of occurrence of an event at each time point in the time series and a degree of abnormality of each of the plurality of event series.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile