The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jun. 18, 2021
Applicant:

Hyundai Mobis Co., Ltd., Seoul, KR;

Inventors:

Tae Hyun Kim, Seoul, KR;

Jung Kyu Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01);
Abstract

An AI based defect inspecting device and method is disclosed. The present embodiment, in determining the good or defective product using the deep learning-based classification model based on an image of the product, provides a defect inspecting device and method for providing a basis for determining a good/defective product provided by a deep learning-based classification model using explainable AI (XAI) generating a category set for the basis, and continuously updating parameters of the deep learning-based classification model using the category set.


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Quick Actions:

Kim, Tae. (2026). Device and method for defect inspection based on explainable artificial intelligence (U.S. Patent No. 12608602). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12608602

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