The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Aug. 23, 2024
L&t Technology Services Limited, Chennai, IN;
Kaushik Halder, Chennai, IN;
Madhusudan Singh, Bangalore, IN;
L&T TECHNOLOGY SERVICES LIMITED, Chennai, IN;
Abstract
A method and system of determining anomalies in a target system using a large language model (LLM), is disclosed. A processor receives a user experience corresponding to the target system, and specification data of the target system from a user. A first set of parameters is determined based on the user experience and the specification data. A cause is determined corresponding to the at least one anomaly in the target system. An impact of the cause corresponding to the at least one anomaly is determined. A region of interest (ROI) in the target system corresponding to the anomaly is determined. One or more correlated region of interests (ROIs) in the target system corresponding to the at least one ROI is determined. One or more correlational anomalies are determined in the one or more correlated ROIs by prompting the LLM based on a fifth interrogative prompt.