The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Dec. 04, 2023
Applicant:

Envisics Ltd, Milton Keynes, GB;

Inventor:

Sebastian R. De Echaniz, Milton Keynes, GB;

Assignee:

Envisics Ltd., Milton Keynes, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/22 (2006.01);
U.S. Cl.
CPC ...
G03H 1/2294 (2013.01); G03H 1/2286 (2013.01);
Abstract

There is provided a method of calibrating a holographic projector. The method comprises displaying a primary diffractive pattern on a display device, wherein the primary diffractive pattern comprises a first hologram of a first target image and a phase-ramp function. The method further comprises illuminating the primary diffractive pattern to form a first holographic reconstruction of the first target image on a replay plane. The first target image comprises a picture area and a non-picture area. The phase-ramp function is arranged to translate the first holographic reconstruction. The method further comprises blocking at least a portion of the first holographic reconstruction using a mask, wherein the mask is arranged to block the non-picture area in the absence of the phase-ramp function. The method further comprises measuring a property of a boundary between the picture area and the non-picture area. There is further provided a holographic projection system.


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