The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Feb. 10, 2023
Applicant:

Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Gao Yang, Singapore, SG;

Alvin Kok, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B 7/00 (2021.01); A61B 90/20 (2016.01); G02B 7/28 (2021.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G03B 7/00 (2013.01); A61B 90/20 (2016.02); G02B 7/28 (2013.01); G02B 21/0012 (2013.01); G02B 21/365 (2013.01);
Abstract

An apparatus is disclosed which is to identify a feature of an image captured from a first focal plane; determining a focus position relative to the first focal plane; and to determine an aperture setting. At the focus position and the aperture setting, a depth of field is provided. The apparatus may be further configured to determine at least one of a second plane and a third plane relative to the first focal plane. At the focus position and the aperture setting, the at least one of the second plane or the third plane is in focus.


Find Patent Forward Citations

Yang, Gao. (2026). Apparatus and method for an imaging device (U.S. Patent No. 12607902). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607902

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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