The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Aug. 04, 2021
Rodenstock Gmbh, Munich, DE;
Adam Muschielok, Munich, DE;
Helmut Altheimer, Baisweil-Lauchdorf, DE;
Patrick Kerner, Oberhaching, DE;
Martin Zimmermann, Kleinberghofen, DE;
Leo Schmid, Diessen, DE;
Rodenstock GmbH, Munich, DE;
Abstract
Method for determining a surface model for calculating a surface of an ophthalmic lens from a set of order parameters for the lens or from variables depending on the order parameters. The method includes providing a training data set having order parameter sets; providing a target value of a property of the lens for each of the order parameter sets; providing a surface model with parameters; and determining optimized values for the parameters using the provided target values by optimizing the values for the parameters by minimizing/maximizing a target function for the parameters. The target function for the parameters for each of the order parameter sets has a term which assumes a minimum/maximum when the provided target value coincides with the value of the same property of a lens which is calculatable with the surface model for given values of the parameters for the corresponding order parameter set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile