The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jan. 18, 2022
Tsinghua University, Haidian District, CN;
Nuctech Company Limited, Haidian District, CN;
Zhiqiang Chen, Haidian District, CN;
Li Zhang, Haidian District, CN;
Yi Cheng, Haidian District, CN;
Qingping Huang, Haidian District, CN;
Mingzhi Hong, Haidian District, CN;
Minghua Qiu, Haidian District, CN;
Yao Zhang, Haidian District, CN;
Jianxue Yang, Haidian District, CN;
Lei Zheng, Haidian District, CN;
Tsinghua University, Haidian District, CN;
NUCTECH COMPANY LIMITED, Haidian District, CN;
Abstract
A radiographic inspection device and a method of inspecting an object are provided. The radiographic inspection device includes a support frame, where an inspection space applicable to inspect an object is formed within the support frame, and the inspection space has a first opening connecting to an outside; a transfer mechanism applicable to carry the object and move through the inspection space; a shielding curtain mounted at the first opening; and a driving mechanism. The driving mechanism includes: a driver mounted on the support frame; and a joint portion, where an upper end of the shielding curtain is connected to the joint portion. The driver is configured to synchronously drive two ends of the joint portion, so that the shielding curtain moves up and down with the joint portion to open or close the first opening.