The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Dec. 21, 2021
Applicant:
Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;
Inventors:
Eric Lammel, Leipzig, DE;
Torsten Pechstein, Radebeul, DE;
Assignee:
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/88 (2006.01); A01K 61/90 (2017.01); B65G 43/00 (2006.01); G01N 21/89 (2006.01); G01S 17/10 (2020.01); G01S 17/86 (2020.01);
U.S. Cl.
CPC ...
G01S 17/88 (2013.01); A01K 61/90 (2017.01); B65G 43/00 (2013.01); G01N 21/89 (2013.01); G01S 17/10 (2013.01); G01S 17/86 (2020.01); B65G 2201/04 (2013.01); B65G 2203/042 (2013.01);
Abstract
The present disclosure relates to a method for operating a measuring point in process engineering, wherein at least one Lidar (light detection and transmission) system is used at the measuring point, comprising: acquiring spatial information from the surroundings of the measuring point by means of the Lidar system; extracting object information from the spatial information; and reconstructing and identifying objects on the basis of the object information and associating the object information with the reconstructed and identified objects.