The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Feb. 04, 2022
Applicant:

Osaka University, Osaka, JP;

Inventors:

Michisato Toyoda, Osaka, JP;

Toshinobu Hondo, Osaka, JP;

Hiroshi Nakayama, Osaka, JP;

Assignee:

OSAKA UNIVERSITY, Osaka, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2021.01); G01N 30/02 (2006.01); H01J 49/04 (2006.01); H01J 49/14 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
G01N 27/62 (2013.01); H01J 49/0468 (2013.01); H01J 49/0495 (2013.01); H01J 49/14 (2013.01); H01J 49/26 (2013.01); G01N 30/02 (2013.01);
Abstract

Provided is a technique to carry out mass spectrometry of a wide variety of subject compounds to be analyzed, each of which is extracted in a supercritical fluid. A mass spectrometer () includes: a supercritical fluid introduction section () for introducing and releasing, to vacuum, a supercritical fluid in which a subject compound for mass spectrometry is contained (extracted); an ionization section () that ionizes the subject compound which is extracted in the supercritical fluid, the ionization being carried out in the vacuum by a molecular reaction involving proton transfer; and a mass measurement section () that measures a mass of the subject compound which has been ionized.


Find Patent Forward Citations

Toyoda, Michisato. (2026). Mass spectrometry device, and mass spectrometry method (U.S. Patent No. 12607600). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607600

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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