The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Apr. 04, 2023
Applicant:

Thermo Electron Scientific Instruments Llc, Madison, WI (US);

Inventors:

Francis Deck, Madison, WI (US);

Justin Morrow, Cincinnati, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01N 23/2251 (2018.01); H01J 37/22 (2006.01); G02B 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); G01N 21/65 (2013.01); H01J 37/228 (2013.01); G01N 2201/0636 (2013.01); G02B 17/008 (2013.01);
Abstract

A beam extraction system is provided. The beam extraction system includes a first focusing optic, a second focusing optic, and an optic relay coupled to the first focusing optic and the second focusing optic. The first focusing optic is configured to form a light beam from light collected from a sample positioned at a focal point of the first focusing optic. The second focusing optic is configured to couple the light beam to a detector. The optic relay provides an optic path for the light beam from the first focusing optic to the second focusing optic.


Find Patent Forward Citations

Deck, Francis. (2026). Optical extraction probe for electron microscope and other vacuum chambers (U.S. Patent No. 12607582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607582

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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