The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jun. 30, 2022
Applicant:

Powerco SE, Salzgitter, DE;

Inventors:

Mathias Kraken, Braunschweig, DE;

Erik Rohkohl, Wolfenbüttel, DE;

Sven Rathmann, Braunschweig, DE;

Malte Schönemann, Braunschweig, DE;

Alexander Tornow, Ummern, DE;

Assignee:

PowerCo SE, Salzgitter, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01); H01M 10/0525 (2010.01); H01M 10/0585 (2010.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/04 (2013.01); G01N 2223/40 (2013.01); H01M 10/0525 (2013.01); H01M 10/0585 (2013.01);
Abstract

A method for determining the placement accuracy of a plurality of electrode sheets, wherein the electrode sheets extend on mutually parallel planes and are stacked on top of one another and form a stack; wherein the placement accuracy describes positions of the edges of all of the electrode sheets relative to one another in the stack; wherein the method is carried out using a measuring device having a two-dimensionally resolving X-ray system with at least one beam source for X-ray radiation and a detector.


Find Patent Forward Citations

Kraken, Mathias. (2026). Method for determining the placement accuracy of a plurality of electrode sheets in a stack (U.S. Patent No. 12607575). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607575

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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