The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jun. 05, 2024
Applicant:

Watlow Electric Manufacturing Company, St. Louis, MO (US);

Inventors:

David P. Culbertson, Bristol, WI (US);

Steven T. Jystad, Winona, MN (US);

Roger Brummell, Hannibal, MO (US);

Sanhong Zhang, Wildwood, MO (US);

Jeremy Ohse, St. Louis, MO (US);

Peter Koss, Elkhorn, WI (US);

Austin Johannes, Winona, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/18 (2006.01); G01K 7/16 (2006.01); G01K 19/00 (2006.01);
U.S. Cl.
CPC ...
G01K 7/183 (2013.01); G01K 2007/163 (2013.01); G01K 19/00 (2013.01);
Abstract

A method of calibrating temperature of a resistive element includes: generating a standard resistance-temperature (R-T) curve for the resistive element in an isothermal condition, wherein the resistive element comprises a material with a Curie temperature; generating an operational R-T curve for the resistive element during a normal operation of the resistive element; shifting the operational R-T curve toward the standard R-T curve at the Curie temperature to generate an adjusted operational R-T curve; and adjusting a measured temperature of the resistive element based on a resistance of the resistive element and the adjusted operational R-T curve.


Find Patent Forward Citations

Culbertson, David. (2026). Resistance calibration and monitoring of thermal systems (U.S. Patent No. 12607521). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607521

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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