logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12607519 B1

PDFFull Text
Date of Patent:
Apr. 21, 2026

Filed:

Dec. 14, 2022

Method and system for determining the state of a sensor through a substrate

Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Ghislain Despesse, Grenoble, FR;

Olivier Freychet, Grenoble, FR;

Nicolas Garraud, Grenoble, FR;

Julien Marianne, Fontaine, FR;

Sébastien Boisseau, Grenoble, FR;

Tristan Caroff, Grenoble, FR;

Assignee:

COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;

Attorney:

BakerHostetler

Primary Examiner:

Daniel Pihulic

Int. Cl.
CPC ...
G01K 7/01 (2006.01); G01R 23/02 (2006.01);
U.S. Cl.
CPC ...
G01K 7/01 (2013.01); G01R 23/02 (2013.01);
Abstract

A method for determining the state of at least one sensor, the method using a first electromechanical transducer and a second electromechanical transducer that are coupled to a substrate, and a non-linear electrical circuit connected between the second electromechanical transducer and the sensor, the method comprising the steps of: applying an electrical signal at a first amplitude to the terminals of the first electromechanical transducer, and determining a first set of values of a parameter characteristic of the electrical impedance of the first electromechanical transducer in response to the application of the electrical signal; applying the electrical signal at a second amplitude to the terminals of the first electromechanical transducer, and determining a second set of values of the parameter characteristic of the impedance; measuring a difference between the first set of values and the second set of values; determining a state of the sensor on the basis of the difference between the first set of values and the second set of values.

Find Patent Forward Citations

Despesse, Ghislain. (2026). Method and system for determining the state of a sensor through a substrate (U.S. Patent No. 12607519). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607519

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…