The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

May. 19, 2022
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventor:

Alexey Malinovskiy, Maulburg, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01);
Abstract

A measuring system and a corresponding measuring method for reliably determining a fill level of a filling material in a container comprises a radar-based measuring device having a transmission unit via which high-frequency signals can be transmitted towards the filling material and received as received signals after reflection on the filling material surface; furthermore having a signal generation unit which generates the high-frequency signal to be transmitted; and having a receiving unit which records the received signal. In an evaluation unit of the measuring system, a machine learning algorithm is designed such that the fill level can be detected on the basis of the received signal. By the machine learning algorithm, received signals which are recorded under complex measuring conditions such as interference and multiple reflections can be interpreted much more reliably.


Find Patent Forward Citations

Malinovskiy, Alexey. (2026). Fill-level measurement using a machine learning algorithm (U.S. Patent No. 12607493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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