The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Sep. 19, 2024
China University of Mining and Technology, Xuzhou, CN;
Xinqiu Fang, Xuzhou, CN;
Yang Song, Xuzhou, CN;
Ningning Chen, Xuzhou, CN;
Haotian Feng, Xuzhou, CN;
Minfu Liang, Xuzhou, CN;
Gang Wu, Xuzhou, CN;
Ziyue Xu, Xuzhou, CN;
Fukang Qiao, Xuzhou, CN;
China University of Mining and Technology, Xuzhou, CN;
Abstract
An FBG curvature sensing test device and a test method thereof are provided. The test device includes a test platform, an FBG demodulator, and a computer. The test platform includes an optical plate and two constraint components, test pieces are connected between two constraint components, where the constraint component includes an X-axis displacement stage, a Z-axis rotation stage and a fixture, the X-axis displacement stage is connected to the optical plate and can move along an X-axis direction, one end of the Z-axis rotation stage is connected to the X-axis displacement stage, and the other end of the Z-axis rotation stage is connected to the fixture; the FBG demodulator is configured to convert an optical signal of a wavelength change monitored by the FBG test line based on the deformation of the test piece into an electrical signal; the computer is coupled to the FBG demodulator.