The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Oct. 12, 2023
Applicant:

2pi Inc., Cambridge, MA (US);

Inventors:

Tian Gu, Acton, MA (US);

Fan Yang, Cambridge, MA (US);

Mikhail Y. Shalaginov, Cambridge, MA (US);

Xiaochen Sun, Chino Hills, CA (US);

Juejun Hu, Newton, MA (US);

Assignee:

2Pi Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G02B 1/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); G02B 1/002 (2013.01);
Abstract

A wide field-of-view sensor or projector includes a transparent substrate with one or more apertures on one side, and one or more chip stacks joined to the opposite side. Each chip stack includes a flat optics layer (e.g., metasurface), at least one spacer layer, an optional filter layer, and either an image sensor or a light source. In one example, two apertures and two corresponding chip stacks are provided; both chip stacks include image sensors but different metasurfaces and filters to capture different information from the scene. In an alternative embodiment, the two chip stacks include a light source and an image sensor, to function as a light projector and a light receiver, respectively. In other examples, two apertures and a single chip stack are provided, where the single chip stack include two metasurface and/or two filters corresponding to the two apertures.


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