The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jul. 16, 2024
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Xiaowei Yu, Farmington Hills, MI (US);

Donghao Liu, Troy, MI (US);

Robin James, Rochester Hills, MI (US);

Ming Wang, Stering Heights, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01B 7/04 (2006.01); H01M 4/04 (2006.01);
U.S. Cl.
CPC ...
G01B 7/042 (2013.01); H01M 4/0435 (2013.01);
Abstract

Systems and methods are provided for monitoring properties of a web during a roll-to-roll manufacturing process. The methods may include moving the web past a first roller such that the web contacts the first roller, wherein the first roller includes a first contact strip formed of an electrically conductive material and extends circumferentially about the first roller, applying a voltage to the first contact strip while moving the web past the first roller, such that the voltage conducts through the web to a second contact strip, measuring the voltage received by the second contact strip, determining local resistance values relative to positions of the web based on the difference in the voltage applied to the first contact strip and the voltage received by the second contact strip, and determining at least one property of the web relative to the positions of the web based on the local resistance values.


Find Patent Forward Citations

Yu, Xiaowei. (2026). Systems and methods for in-line monitoring of properties of a web during a manufacturing process (U.S. Patent No. 12607446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607446

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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