The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Aug. 24, 2022
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Yasunori Kondo, Niwa-Gun, JP;

Tetsuya Matsushita, Niwa-Gun, JP;

Takuya Kojima, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/016 (2006.01); B23Q 15/12 (2006.01);
U.S. Cl.
CPC ...
G01B 5/016 (2013.01); B23Q 15/12 (2013.01);
Abstract

A method includes: installing a square calibration master on a table, and measuring each of measurement surfaces A, B, and C of the square calibration master by a position measurement sensor attached to a main spindle; calculating a first squareness between the measurement surfaces A and B; calculating a second squareness between the measurement surfaces A and C; calculating a difference between the first squareness and the second squareness; comparing the difference with a preliminarily set difference threshold value; calculating an average value of the first squareness and the second squareness when the difference is equal to or less than the difference threshold value, and calculating a corrected squareness based on an angular deviation and the first squareness or the second squareness when the difference exceeds the difference threshold value; and setting the compensation parameter based on the average value or the corrected squareness.


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