The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jan. 26, 2018
Applicant:

United Technologies Corporation, Farmington, CT (US);

Inventors:

David Ulrich Furrer, Marlborough, CT (US);

Sergei F. Burlatsky, West Hartford, CT (US);

Assignee:

RTX CORPORATION, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/153 (2017.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 12/90 (2021.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B22F 10/34 (2021.01); B22F 12/44 (2021.01);
U.S. Cl.
CPC ...
B29C 64/153 (2017.08); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 12/90 (2021.01); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 10/34 (2021.01); B22F 12/44 (2021.01); B22F 2203/11 (2013.01); B22F 2999/00 (2013.01); Y02P 10/25 (2015.11);
Abstract

A powder processing machine includes a work bed, a powder deposition device operable to deposit layers of powder in the work bed, an energy beam device operable to emit an energy beam with a variable beam power and scan the energy beam in a path across the powder in the work bed with a variable beam scan rate to melt and fuse regions of the powder, a sensor operable to detect process characteristics in the work bed by location in the work bed during scanning of the energy beam and produce signals representative of the process characteristics and locations, and a controller in communication with the sensor to receive the signals. The controller is configured to identify anomalies in the process characteristics and responsively adjust at least one of the beam power or the beam scan rate at the locations of the anomalies.


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