The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jun. 23, 2021
Applicant:
Kyocera Corporation, Kyoto, JP;
Inventors:
Hiroyuki Nanahara, Satsumasendai, JP;
Futoshi Isobe, Satsumasendai, JP;
Yusuke Nagaoka, Satsumasendai, JP;
Assignee:
KYOCERA CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C04B 35/58 (2006.01); C04B 35/5831 (2006.01); C04B 41/81 (2006.01);
U.S. Cl.
CPC ...
B23B 27/14 (2013.01); C04B 35/58014 (2013.01); C04B 35/5831 (2013.01); C04B 41/81 (2013.01); C04B 2235/3813 (2013.01); C04B 2235/386 (2013.01); C04B 2235/3886 (2013.01); C04B 2235/402 (2013.01); C04B 2235/762 (2013.01); C04B 2235/94 (2013.01);
Abstract
An insert of the present disclosure includes a cBN sintered compact containing cBN and TiN. The cBN occupies 60% or more of the cross-sectional area of the cBN sintered compact observed. TiN (200) is higher than cBN (111), where the TiN (200) is an X-ray intensity on a (200) plane of the TiN and the cBN (111) is an X-ray intensity on a (111) plane of the cBN, obtained by X-ray diffraction on the cBN sintered compact.
Nanahara, Hiroyuki. (2026). Insert and cutting tool (U.S. Patent No. 12605769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12605769
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile