The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Dec. 02, 2024
Applicants:

Imec Vzw, Leuven, BE;

Katholieke Universiteit Leuven, Leuven, BE;

Stichting Imec Nederland, Eindhoven, NL;

Inventors:

Anirudh Kumar Parag, Leuven, BE;

Bogdan Raducanu, Heverlee, BE;

Chris Van Hoof, Leuven, BE;

Nick Van Helleputte, Korbeek-Dijle, BE;

Stefano Stanzione, Veldhoven, NL;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01); G01S 5/22 (2006.01);
U.S. Cl.
CPC ...
A61B 8/0841 (2013.01); G01S 5/22 (2013.01);
Abstract

A device for monitoring an implant comprises: an array of ultrasound transducer elements configured to receive a localization ultrasound signal from the implant; and a signal processor configured to, for each ultrasound transducer element of at least a subset of ultrasound transducer elements, identify a time point corresponding to a peak intensity of the received localization ultrasound signal at the ultrasound transducer element, wherein relative time delays between the time points identified for the ultrasound transducer elements form information relating to a location of the implant.


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