The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Sep. 13, 2022
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Bart Lenaerts, Zutendaal, BE;

Thomas Mahieu, Vleteren, BE;

Bart M.A. Missotten, Herent, BE;

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); G01N 21/3581 (2014.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1273 (2013.01); G01N 21/3581 (2013.01); G01N 21/85 (2013.01); G01N 2201/067 (2013.01); G01N 2201/1296 (2013.01);
Abstract

A method and system are provided for determining a threshing loss in a threshing system. The method includes irradiating a crop sample downstream at least a portion of a threshing system with electromagnetic waves having a frequency in a range of 0.1-10 THz, measuring a reflection and/or a transmission of the electromagnetic waves by the crop sample, establishing, based on the measured reflection and/or transmission, an at least two-dimensional terahertz image of the crop sample, identifying at least one ear in the terahertz image, identifying at least one grain kernel in the identified ear, and determining the threshing loss based on the identified grain kernel.


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