The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Oct. 30, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Deokha Shin, Suwon-si, KR;

Dahee Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/683 (2023.01); H04N 25/77 (2023.01); H04N 25/78 (2023.01);
U.S. Cl.
CPC ...
H04N 25/683 (2023.01); H04N 25/77 (2023.01);
Abstract

An image sensor test device includes: an interface configured to transmit a control signal to an image sensor to be tested; and a host device configured to transmit, to the image sensor, a storage control signal instructing to store information about a bad pixel which is determined based on an output signal of the image sensor, wherein the output signal corresponds to the control signal, and wherein the storage control signal includes a signal of instructing to store the information about the bad pixel in a memory area of a plurality of memory areas.


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Shin, Deokha. (2026). Image sensor including plural memory areas for storing bad pixel information and image sensor test device (U.S. Patent No. 12604113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12604113

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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