The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Jul. 19, 2021
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Bernhard Metzler, Dornbirn, AT;
Harald Vennegeerts, Berlin, DE;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Abstract
A method for enhancing images for metrological applications. A first set of first images is provided, wherein the first set comprises at least one first image, the first set representing a scene of interest, and a second set of second images is provided, wherein the second set comprises at least one second image, the second set representing at least a part of the scene of interest. The method comprises the following steps: 1) jointly processing the first set and the second set by a neural network, and 2) outputting a third set of images by the neural network, the third set comprising at least one processed image, from which is determinable the position and/or orientation of the at least one object with a processed precision, wherein the processed precision is equal to or higher than the initial precision.