The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jan. 11, 2024
Applicant:

SK on Co., Ltd., Seoul, KR;

Inventors:

Dong Whan Shin, Daejeon, KR;

Hye Ju Jang, Daejeon, KR;

Assignee:

SK On Co., Ltd., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G01T 7/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01T 7/00 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

According to various embodiments, there may be provided a method for determining an abnormality in image acquisition equipment, which includes: acquiring one or more 2-dimensional (2D) images by imaging a specific region; acquiring at least one of an average brightness value, a signal to noise ratio (SNR) value and a contrast to noise ratio (CNR) value for the one or more acquired 2-dimensional images; and determining whether the image acquisition equipment is abnormal based on the at least one of the acquired average brightness value, SNR value and CNR value, and a device therefor.


Find Patent Forward Citations

Shin, Dong. (2026). Method and device for determining abnormality in image acquisition equipment (U.S. Patent No. 12602829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602829

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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