The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jun. 28, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hyeongseok Son, Suwon-si, KR;

Seungin Park, Suwon-si, KR;

Byung In Yoo, Suwon-si, KR;

Dongwook Lee, Suwon-si, KR;

Solae Lee, Suwon-si, KR;

Sangil Jung, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01); G06V 10/771 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01); G06V 10/771 (2022.01);
Abstract

An apparatus includes one or more processors configured to generate a plurality of feature maps having respective different resolutions based on an input image; and update, for each of the plurality of transformer layers, respective position estimation information comprising first position information of a respective bounding box corresponding to one object query and second position information of respective key points corresponding to the one object query, wherein each of the plurality of transformer layers includes a self-attention model configured to generate respective intermediate data by performing self-attention on respective content information on a feature of the input image; and a cross-attention model configured to generate respective output data by performing cross-attention on respective one or more feature maps among the plurality of feature maps and the respective generated intermediate data.


Find Patent Forward Citations

Loading…