The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jan. 11, 2024
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yuji Iwadate, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G16H 50/20 (2018.01); G06T 2207/10068 (2013.01); G06T 2207/30096 (2013.01);
Abstract

The image processing deviceX includes a first acquisition meansX, a second acquisition meansX, and an inference meansX. The first acquisition meansX acquires a set value of a first index indicating an accuracy relating to a lesion analysis. The second acquisition meansX acquires, for each of plural models which make inference regarding a lesion, a predicted value of a second index, which is an index of the accuracy other than the first index, on an assumption that the set value of the first index is satisfied. The inference meansX makes inference regarding the lesion included in an endoscopic image of an examination target, based on the predicted value of the second index and the plural models.


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