The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Feb. 23, 2021
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Qiong Wu, Beijing, CN;

Mengjun Hou, Beijing, CN;

Xiangguo MA, Beijing, CN;

Kai Geng, Beijing, CN;

Zhukai Liu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/64 (2006.01); G06T 3/40 (2006.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 21/6456 (2013.01); G06T 3/40 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06T 7/80 (2017.01); G06T 2207/10064 (2013.01); G06T 2207/20061 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30072 (2013.01);
Abstract

A method for analyzing a biochip image is provided, including: (S) acquiring and preprocessing the biochip image to obtain a preprocessed image; (S) performing a correction for angle deflection on the preprocessed image to obtain a deflection-corrected image; and (S) performing an enhancement processing on the deflection-corrected image, and identifying a positive or negative of an area of interest in the preprocessed image according to an image on which the enhancement processing has been performed. An apparatus () for analyzing a biochip image, a method for analyzing an image, a computer device () and a storage medium are disclosed.


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