The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Jun. 29, 2023
Fujifilm Corporation, Tokyo, JP;
Kimito Katsuyama, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an image analysis apparatus, an image analysis method, and a program that can reduce erroneous detection of defective portions. An image analysis apparatus includes a processor. The processor is configured to acquire an infrared thermal image that is a captured image of a structure to be inspected, acquire a visible image that is a captured image of the structure to be inspected, determine a temperature defect from the infrared thermal image, and estimate a cause of the temperature defect on the basis of, for the temperature defect, at least temperature defect information obtained from the infrared thermal image, and surface defect information obtained from the visible image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile