The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jul. 19, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kamal Jnawali, Tustin, CA (US);

Tien Cheng Bau, Irvine, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/4053 (2024.01); G06T 3/4046 (2024.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 3/4046 (2013.01); G06T 5/70 (2024.01);
Abstract

One embodiment provides a method generating a first image crop and a second image crop randomly extracted from a low-quality image and a high-quality image, respectively. The method further comprises comparing the first image crop and the second image crop using a plurality of loss functions including pixel-wise loss to calculate losses, and optimizing a model trained to estimate a realistic scale-independent blur kernel of a low-resolution (LR) blurred image by minimizing the losses.


Find Patent Forward Citations

Jnawali, Kamal. (2026). Unsupervised learning-based scale-independent blur kernel estimation for super-resolution (U.S. Patent No. 12602740). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602740

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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