The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Nov. 17, 2021
Applicant:

Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;

Inventors:

Jung Won Lee, Seoul, KR;

Ye Seul Park, Incheon, KR;

Chang Nam Lim, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/022 (2023.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01); G06F 16/285 (2019.01);
Abstract

A dataset validating method based on a feature coverage according to an exemplary embodiment of the present disclosure includes extracting a feature of a first dataset including a plurality of data using a classification model trained for a predetermined second dataset; clustering labels of the first dataset according to the extracted feature; and validating a coverage of a partial dataset which is a part selected from the first dataset based on the clustering result.


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Lee, Jung. (2026). Apparatus and method for validating dataset based on feature coverage (U.S. Patent No. 12602596). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602596

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