The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 16, 2022
Applicant:

Xiaolin Wang, San Jose, CA (US);

Inventors:

Xiaolin Wang, San Jose, CA (US);

Michael Rinehart, Pleasanton, CA (US);

Assignee:

[object Object];

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/186 (2020.01); G06F 40/194 (2020.01); G06F 40/205 (2020.01); G06F 40/216 (2020.01); G06F 40/289 (2020.01); G06N 5/022 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 40/186 (2020.01); G06F 40/194 (2020.01); G06F 40/205 (2020.01); G06F 40/216 (2020.01); G06F 40/289 (2020.01); G06N 5/022 (2013.01); G06N 20/00 (2019.01);
Abstract

A system and method for templatizing documents across data sources is disclosed. The system includes a scanner to scan a plurality of files to retrieve a plurality of textual content. The system includes a pre-processor module to refine an efficacy corresponding to the scanned plurality of files by using a classifier to identify textual content with a similar template. The system includes an extraction module to extract a plurality of common sequences and sub-sequences from the plurality of files. The system includes a ranking module to rank the plurality of common sequences and sub-sequences based on a score. The system includes a feature vector generating module to generate a feature vector from the plurality of common sequences and sub-sequences. The system includes a determining module to determine a threshold value for the classifier thereby developing the classifier automatically to search for positive files with similar templates in the organization.


Find Patent Forward Citations

Wang, Xiaolin. (2026). Method and system for exemplar learning for templatizing documents across data sources (U.S. Patent No. 12602538). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602538

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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