The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Sep. 13, 2023
Dell Products L.p., Round Rock, TX (US);
Huijuan Fan, Chengdu, CN;
Steven Wenguo Shen, Chengdu, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
Methods, system, and non-transitory processor-readable storage medium for a resource evaluation system are provided herein. An example method includes obtaining defect data obtained in response to executing software on a plurality of tester systems. The resource evaluation system determines a performance weighted metric associated with a defect detection resource and the defect data. Using the performance weighted metric, the resource evaluation system determines a defect scope delta percentage associated with the defect detection resource and the defect data. The resource evaluation system then determines a defect detection resource score based on the defect scope delta percentage.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile