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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12602301 B1

PDFFull Text
Date of Patent:
Apr. 14, 2026

Filed:

Nov. 10, 2023

System level testing using a central test manager

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Edward C. Mccain, Campbell Hall, NY (US);

Rajani Guduru, Bengaluru, IN;

Ali Y. Duale, Poughkeepsie, NY (US);

Zahed Hossain, Bangalore, IN;

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);

Attorneys:

Edward Wixted, Esq.

Kevin P. Radigan, Esq.

Heslin Rothenberg Farley & Mesiti P.C.

Primary Examiner:

Joseph O Schell

Int. Cl.
CPC ...
G06F 11/36 (2025.01); G06F 11/26 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 11/3688 (2013.01);
Abstract

A test control process initiates processing of a test case to be used in system level testing of a system unit under test. A query is sent, by the test control process, to a central test manager to determine a history of the test case. The history of the test case is obtained by the test control process based on the query. Processing of the test case continues, based on the history.

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Mccain, Edward. (2026). System level testing using a central test manager (U.S. Patent No. 12602301). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602301

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