The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Apr. 01, 2024
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Andy Yang, Cupertino, CA (US);

Paul Richard Bonderson, III, Sunol, CA (US);

Sandeep Bhatia, San Jose, CA (US);

Boone Severson, Waunakee, WI (US);

Sushma Honnavara-Prasad, Los Gatos, CA (US);

Indranil Chakraborty, Mountain View, CA (US);

Christopher Aaron Clark, Madison, WI (US);

Matthew Leever Hedlund, Sun Prairie, WI (US);

Shriram Nagarajan, Santa Clara, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2041 (2013.01); G06F 11/27 (2013.01); G06F 2201/805 (2013.01);
Abstract

The disclosure provides a self-repairable chip for silent data corruption (SDC) issues. The self-repairable chip is configured to detect data corruption in a plurality of processing units, identifying the defective tiles of the processing units, and repairing the defective tiles by replacing the defective tiles with redundant rows or columns. The self-repairable chip is further configured to determine whether one or more logics where the data corruption occurred must work or may work and replace the defective tiles with redundant rows or columns when the logic where the data corruption occurred may work.


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